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Latest News for June 10th, 2020

Tan receives NSF award on machine-learning based VLSI reliability modeling and design

ECE Prof. Sheldon Tan received a three-year $500K award from the National Science Foundation for exploring data-driven and deep learning based approaches to addressing the VLSI reliability and robust chip design. Recently machine learning, especially deep learning is gaining much attention due to the breakthrough performance in various cognitive applications. Machine learning for electronic design...