NOISE AND FLUCTUATIONS CONTROL IN ELECTRONIC DEVICES
See the book COVER
Edited by Alexander A. Balandin,
University of California at Riverside, California, USA
August 2002 / Approx. 400 pages, Size 81/2”x11”/Hardcover
NOISE AND FLUCTUATIONS CONTROL IN ELECTRONIC DEVICES is the first and a single
reference source to bring together the latest aspects of noise research for a wide range
of multidisciplinary audience. The goal of this book is to give an update of
state-of-the-art in this interdisciplinary field, while focusing on new trends
in electronic device noise research. Such new trends include investigation of
noise in electronic devices based on novel materials, effects of downscaling
on the device noise performance, fluctuations and noise control in nanodevices,
effective methods of noise suppression, etc. This book contains 18 state-of-the-art
review chapters written by 33 internationally renowned experts from 15 countries.
This book has about 1,500 bibliographical citations and several hundreds of
illustrations, figures, tables and equations. This book is a definite reference
source for students, engineers, and specialists both in academia and industry
working in such different fields as electronic and optoelectronic devices,
electrical and electronic engineering, solid-state physics, nanotechnology,
wireless communications, and telecommunication. This book will be an essential
reference to a variety of individuals, research groups, laboratories, libraries
at universities and research institutions around the world. It could be a
perfect textbook for advanced level graduate course in the electronic devices.
SELECTED CONTENTS
Low-frequency Noise in GaN-based Field Effect Transistors Material Processing
and Low Frequency Excess Noise in GaN Thin Films and Devices 1/f noise in
Polycrystalline Thin film Transistors Noise issues in Cold Cathodes for
Vacuum Microelectronic Applications Low-frequency Noise Performance of
Scaled Deep Submicron MOS Devices Low-Frequency Noise in Advanced Bipolar
Junction Transistors and Circuits Random Telegraph Signals in Deep Submicron
Metal-Oxide-Semiconductor Field-Effect Transistors Hot-electron Noise
in III-V Semiconductor Structures for Ultrafast Devices Sub-Poissonian
Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions
Noise Modeling and Measurement Techniques in Deep Submicron SOI Devices
Impedance Field Noise Simulations of Si Devices Operating under DC and
AC Steady State Conditions Generation Recombination Noise in Semiconductors
Monte Carlo Calculations of Shot-noise in Mesoscopic Structures Sources
of Lorentzian Components in the Low-frequency Noise Spectra of Submicron
MOSFETs Transport and Noise in Mesoscopic Conductors Low Frequency
Noise in Nanomaterials and Nanostructures Noise in Nanodevices and much more ……..
KEY FEATURES
First and only reference source to cover latest and emerging research
aspects of noise in electronic devices
Covers noise issues on electronic devices based on novel materials
such as GaN, silicon-on insulator, polycrystalline thin films, carbon
nanotubes, etc.
Addresses the effect of electronic device downscaling on noise
performance from many different angles
Provides comprehensive coverage of the hottest topics related to
noise and fluctuations in electronic devices.
Presents methods of noise suppression in deep submicron and
nanoscale devices
Eighteen state-of-the-art review chapters written by world-renowned
experts from academia and industry.
A perfect reference source for students, researchers, college and
university professors and specialists working in the field of electronics,
optoelectronics, communications, electrical and electronic engineering,
solid-state physics, materials science, nanotechnology, thin film
technology, device engineering, etc.
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