University of California, Riverside

Department of Electrical Engineering



Book on statistical modeling and analysis for VLSI systems published


Book on statistical modeling and analysis for VLSI systems published
 
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Book on statistical modeling and analysis for VLSI systems published

April 12, 2012

Prof. Sheldon Tan, along with  his former graduate student Dr. Ruijing Shen (now with Synopsys Corporation, Mountain View, CA, USA)  and Dr. Hao Yu from Nanyang Technological University, Singapore,   has published a new monograph book :

 

Ruijing Shen, Sheldon X.-D. Tan and Hao Yu,  Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs,  Springer March 2012,  ISBN-10: 1461407877.

 

It was published by Springer publisher in March 2012. The book provides readers with tools for variational-aware design methodologies and computer-aided (CAD) of VLSI systems. It provide the latest developments for modeling and analysis, with a focus on the statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling of large global interconnects and analog/mixed-signal circuits. It summarizes many recent research results in the Prof. Tan’s research lab.

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