University of California, Riverside

Department of Electrical and Computer Engineering



UCR Research on Three Journal Covers


UCR Research on Three Journal Covers
 
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UCR Research on Three Journal Covers

November 15, 2012

Prof. Mihri Ozkan, Prof. Cengiz S. Ozkan, and co-workers report a new fluorescence quenching microscopy metrology technique that allows the identification of graphene layers and doped/undoped regions across a large graphene landscape by utilizing the fact that undoped regions of graphene quench fluorescence more than the doped regions through resonant energy transfer. Contrast differences in fluorescence across the graphene sheet reveal the complex ring-patterned doping. This metrology technique is well-suited for industrial, large-scale, pristine, and modified graphene sheet surface characterization. Ozkans’ and their co-workers’ related work published as cover articles in high-venue journals: SMALL, NANOSCALE and ADVANCED FUNCTIONAL MATERIALS

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Electrical and Computer Engineering
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University of California, Riverside
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